SiC Power Device Testing Lab

Issuing time:2022-06-27 17:23

The SiC power device testing lab of BASiC Semiconductor Ltd. covers an area of 2000 square metres, it is a versatile lab for power semiconductor R&D and testing focusing on the verification of R&D designs, application of new materials & experimental technologies, together with product functions and reliability test. At present, the power module R&D lab, electrical performance lab, performance and stress analysis lab, electromagnetic susceptibility lab, application lab, and reliability lab have been established.

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11th Floor, Block B, National Engineering Laboratory Building, Nanshan District, Shenzhen, China
+86-755-22670439     +86-755-86706526 info@basicsemi.com
inquiry@basicsemi.com (Industrial)
autobu@basicsemi.com(Automotive)
BASiC Semiconductor Ltd.