Domestic chip be superior in quality! BASiC challenge limit high temperature test completely starts

On August 14, the National New Energy Vehicle Technology Innovation Center (hereinafter referred to as “The National Innovation Center”) invite experts from 13 domestic vehicle and semiconductor companies including BASiC, field to carry out the first test validation project of “China automotive-grade semiconductor Turpan heat test” activities, and held the automotive-grade semiconductor test validation project high temperature testing technology seminar.

Since the end of July 2019, the National Innovation Center has been carrying four test vehicles equipped with a domestically produced silicon based IGBT (insulated-gate bipolar transistor) and silicon carbide diode, silicon carbide MOSFET (metal-oxide semiconductor field effect transistor) for a one-month “extreme high temperature” test project in Turpan, which is also one of the test projects of the China automotive-grade semiconductor vehicle carrying verification.