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BASiC Semiconductor conducts reliability certification for all semiconductor devices and module products in accordance with MIL-STD/JEDEC, AQG324, IEC and other standards. Basic Semiconductor also supports the development of additional reliability and quality certification tests to meet specific application or customer needs. BASiC Semiconductor has outstanding static and dynamic test systems and high-quality reliability verification capabilities. The test equipment serves for chip reliability test (HTRB/HTGB), packaging reliability test (H3TRB/TC/IOL/AC/HTC), static and dynamic test (double-pulse/Agilent/Kelvin/Curve tracer/Surge test), etc., to achieve comprehensive verification of various key performance parameters of power devices.  |
11th Floor, Block B, National Engineering Laboratory Building, Nanshan District, Shenzhen, China
+86-755-22670439 +86-755-86706526
info@basicsemi.com
inquiry@basicsemi.com (Industrial)
autobu@basicsemi.com（Automotive）
BASiC Semiconductor Ltd.
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